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Submission: On August 31 via manual from US — Scanned from DE
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Contact Us Contact Us * Products▾ * Thickness and Flaw Inspection Solutions▾ * Flaw Detectors / Phased Array Flaw Detectors▾ * Ultrasonic Flaw Detectors * Phased Array * Eddy Current Products * Eddy Current Array Products * Bond Testing * Thickness Gauges▾ * 27MG * 45MG * 38DL PLUS * Magna-Mike 8600 * 35RDC * Transducers and Accessories * 72DL PLUS * Transducers and Probes▾ * Single and Dual Element Transducers * Eddy Current Probes * Probes for Tube Inspection * Phased Array Probes * BondMaster Probes * Automated Inspection Systems▾ * Wheel Inspection * Bar Inspection * Tube Inspection * Friction Stir Weld Inspection * NDT Systems Instrumentation ▾ * FOCUS PX / PC / SDK * QuickScan * NDT Industrial Scanners▾ * Weld Inspection Scanners * Corrosion Inspection Scanners * Aerospace/Wind Blade Inspection Scanners * Scanner Accessories * The Olympus Scientific Cloud * Software▾ * WeldSight™ Software * TomoView Software * NDT SetupBuilder Software * OmniScan MX2 and SX Software * OmniPC 4 Software * XRF Analyzers▾ * Handheld and Portable XRF Analyzers▾ * Vanta * Vanta Element * Benchtop and Showroom XRF Analyzers▾ * Vanta * Vanta Element * Vanta GX * In-Line XRF Analysis * Positive Material Identification Equipment▾ * X-STREAM * Applications and Solutions Key * The Olympus Scientific Cloud * Industrial Microscopes▾ * Laser Confocal Microscopes▾ * OLS5100 * Digital Microscopes▾ * DSX1000 * Measuring Microscopes▾ * STM7 * STM7-BSW * Cleanliness Inspector▾ * CIX100 * Light Microscopes▾ * Upright Microscopes * Inverted Microscopes * Modular Microscopes * Semiconductor & Flat Panel Display Inspection Microscopes▾ * MX63 / MX63L * AR Microscopes▾ * SZX-AR1 * Stereo Microscopes▾ * SZX16 * SZX10 * SZX7 * SZ61/SZ51 * Digital Cameras▾ * DP28 * DP74 * SC180 * DP23 * LC35 * DP23M * Image Analysis Software▾ * PRECiV * OLYMPUS Stream * Objective Lenses▾ * MPLAPON * MPLAPON-Oil * MXPLFLN * MXPLFLN-BD * MPLN * MPLN-BD * MPLFLN * MPLFLN-BD * MPLFLN-BDP * LMPLFLN * LMPLFLN-BD * SLMPLN * LCPLFLN-LCD * LMPLN-IR/LCPLN-IR * White Light Interferometry Objective * OEM Microscope Components for Integration * Industrial Microscope FAQ * Customized Solutions * Videoscopes and Borescopes▾ * Videoscopes▾ * IPLEX NX * IPLEX GAir * IPLEX GX/GT * IPLEX G Lite and IPLEX G Lite-W * IPLEX TX * IPLEX Long Scope Solution * Fiberscopes▾ * Small Diameter Fiberscopes * Light Sources * Inspection Assist Software▾ * InHelp * Industries * Resources * Learn * Blog * Support▾ * Contact Us * Service Solutions▾ * Home * Olympus Scientific Cloud * Software Downloads * User Manuals * ISO Certifications * MSDS Datasheets * Compliance and Ethics at Evident * Product Information * Discontinued and Obsolete Products▾ * MultiScan MS5800 ▾ * MultiView Software * TubePro Software * EVIDENT Modern Slavery Act Statement * Applicable products for safety leaflet (IE) NDT SOLUTIONS * Flaw Detectors / Phased Array Flaw Detectors * Ultrasonic Flaw Detectors * EPOCH 6LT * EPOCH 650 * Probes and Transducers * Phased Array * OmniScan X3 and OmniScan X3 64 * OmniScan MX2 * OmniScan SX * FOCUS PX / PC / SDK * PipeWIZARD * Eddy Current Products * NORTEC 600 * Rotating Bolthole Scanners * Tube Probes * Eddy Current Array Products * OmniScan MX ECA/ECT * Eddy Current Probes * Bond Testing * BondMaster 600 * BondMaster Probes * 35RDC * Thickness Gauges * 27MG * 45MG * 38DL PLUS * Magna-Mike 8600 * 35RDC * Transducers and Accessories * 72DL PLUS * Transducers and Probes * Single and Dual Element Transducers * Angle Beam * Atlas European Standard * AWS Wedges & Transducers * CDS Wedges * Contact * Delay Line * Dual Element * EMAT * High-Frequency * Immersion Transducers * Immersion Special * Immersion Accessories * Integral Angle Beam * Normal Incidence Shear Wave * Protected Face * RTD * Special Applications * Spot Weld * Standard Angle Beam * TOFD * Test Blocks * Transducer Cables * Couplant & Adaptors * Eddy Current Probes * Probes for Tube Inspection * Phased Array Probes * EdgeFORM * Weld Series * Dual Array Probes for Welds * Dual Array Probes for Corrosion * Flexible Phased Array Probe * Manual Contact Probes * Small-Footprint Probes * Universal Probes * Near-Wall Probes * Deep Penetration Probes * Immersion Probes * Curved Array Probes * Immersion Corner Wedges for Curved Array Probes * Integrated Wedge and Code Compliant Probes * Wedges * HTHA Probe * RexoFORM Wedge * BondMaster Probes * Automated Inspection Systems * Wheel Inspection * Bar Inspection * Bar Inspection System (BIS)—Phased Array * Bar Inspection System (BIS)—Eddy Current Array * Rotating Billet Inspection System (RBIS) * FOX-IQ * Square Billet Inspection System (SBIS) * Tube Inspection * Rotating Tube Inspection System (RTIS) * In-Line ERW Tube Inspection System * In-Line ERW High-Temperature Inspection System * Off-Line ERW Tube Inspection System * FOX-IQ * PipeWIZARD * LSAW Tube Inspection System * Tube End Inspection System (TEIS) * Friction Stir Weld Inspection * NDT Systems Instrumentation * FOCUS PX / PC / SDK * QuickScan * NDT Industrial Scanners * Weld Inspection Scanners * AxSEAM * SteerROVER * WeldROVER * HST-Lite * Mini-Wheel * COBRA * HSMT-Compact * HSMT-Flex * HST-X04 * VersaMOUSE * Wire Encoder * Corrosion Inspection Scanners * FlexoFORM * SteerROVER * MapSCANNER * MapROVER * HydroFORM Scanner * ChainSCANNER * GLIDER * VersaMOUSE * Mini-Wheel * Aerospace/Wind Blade Inspection Scanners * RollerFORM * Mini-Wheel * GLIDER * VersaMOUSE * Scanner Accessories * CFU Couplant Feed Unit * TRPP 5810 Remote Pulser/Preamplifier * Elastomer Couplant * Interbox * The Olympus Scientific Cloud * Software * WeldSight™ Software * TomoView Software * TomoVIEWER Software -Free * NDT SetupBuilder Software * OmniScan MX2 and SX Software * OmniPC 4 Software XRF ANALYZERS * Handheld and Portable XRF Analyzers * Vanta * Vanta Element * Benchtop and Showroom XRF Analyzers * Vanta * Vanta Element * Vanta GX * In-Line XRF Analysis * Positive Material Identification Equipment * X-STREAM * Applications and Solutions Key * The Olympus Scientific Cloud INDUSTRIAL MICROSCOPES * Laser Confocal Microscopes * OLS5100 * Digital Microscopes * DSX1000 * Measuring Microscopes * STM7 * STM7-BSW * Cleanliness Inspector * CIX100 * Light Microscopes * Upright Microscopes * BX53M * Inverted Microscopes * Inverted Microscopes Solutions * GX53 * Modular Microscopes * BXFM * BXFM-S * BXC Series * Semiconductor & Flat Panel Display Inspection Microscopes * MX63 / MX63L * AR Microscopes * SZX-AR1 * Stereo Microscopes * SZX16 * SZX10 * SZX7 * SZ61/SZ51 * Digital Cameras * DP28 * DP74 * SC180 * DP23 * LC35 * DP23M * Image Analysis Software * PRECiV * OLYMPUS Stream * Objective Lenses * MPLAPON * MPLAPON-Oil * MXPLFLN * MXPLFLN-BD * MPLN * MPLN-BD * MPLFLN * MPLFLN-BD * MPLFLN-BDP * LMPLFLN * LMPLFLN-BD * SLMPLN * LCPLFLN-LCD * LMPLN-IR/LCPLN-IR * White Light Interferometry Objective * OEM Microscope Components for Integration * Industrial Microscope FAQ * Customized Solutions VIDEOSCOPES AND BORESCOPES * Videoscopes * IPLEX NX * IPLEX GAir * IPLEX GX/GT * IPLEX G Lite and IPLEX G Lite-W * IPLEX TX * IPLEX Long Scope Solution * Fiberscopes * Small Diameter Fiberscopes * Light Sources * Inspection Assist Software * InHelp * * Search * My Account * IMS Log in * IMS Registration * App Marketplace * Connected Devices * My Apps * My Data * My Organization * Cloud Log in * Cloud Log in * Log Out * Log Out DE DE | EN | 日本語 (Japanese) | français (French) | 简体中文 (Simplified Chinese) | Deutsch (German) | italiano (Italian) | čeština (Czech) | Español (Spanish) | русский (Russian) | polski (Polish) | português (Portuguese) | 한국어 (Korean) Industrial Solutions INDUSTRIAL MICROSCOPES DSX1000 Contact UsContact Us Get a QuoteGet a Quote * Overview * Applications Loading... * Overview * Applications OVERVIEW DSX1000 DIGITAL MICROSCOPE POWERFUL ANALYSIS, DYNAMIC IMAGING. THE DSX1000 DIGITAL MICROSCOPE COMBINES EASE OF USE WITH ADVANCED FEATURES TO STREAMLINE YOUR INSPECTION WORKFLOW. * Large selection of lenses that are easy to change * Switch between 6 different observation methods by pushing a button * Fast macro to micro viewing * Accurate measurements with a telecentric optical system * Advanced measurements are fast and easy to obtain Watch Video DSX1000 DIGITAL MICROSCOPE MODELS Choose the DSX1000 digital microscope that best suits your needs. ENTRY MODEL View Product Details Easy to Use with Basic Functionality Standard zoom head, offering 5 observation methods. Add to CompareCompare Selected TILT MODEL View Product Details See Your Sample from Many Angles Offers all the features of the Entry model and adds a tilting frame, motorized XY stage, and console. Add to CompareCompare Selected HIGH-RESOLUTION MODEL View Product Details High-Resolution Images for Advanced Analysis Universal zoom head adds differential interference contrast imaging, enhanced depth of focus, and high-resolution 3CMOS mode. Add to CompareCompare Selected HIGH-END MODEL View Product Details 6 Observation Methods and Advanced Measurement Functions Packed with advanced features, this model features the universal zoom head and adds a tilting frame and motorized XY stage with rotation (+ 90°). Add to CompareCompare Selected Compare NowSee Full Specifications Chart Entry Model: category (Entry Model - dsx-1000-em) Tilt Model: category (Tilt Model - dsx-1000-tm) High-Resolution Model: category (High-Resolution Model - dsx-1000-hrm) High-End Model: category (High-End Model - dsx-1000-hem) DSX1000 OBJECTIVE LENSES Our lineup of 17 objective lenses, including super long working distance and high numerical aperture options, offers flexibility to obtain a wide range of images. SUPER LONG WORKING DISTANCE OBJECTIVE LENS Provides a long working distance between the lens and sample. View Product Details HIGH-RESOLUTION, LONG WORKING DISTANCE OBJECTIVE LENS Delivers both high resolution and a long working distance. View Product Details HIGH-PERFORMANCE, HIGH NUMERICAL APERTURE OBJECTIVE LENS Delivers high performance at the nano scale. View Product Details DIGITAL MICROSCOPE FOR FAILURE ANALYSIS Speed combined with guaranteed accuracy and repeatability make the DSX1000 digital microscope the right tool for fast failure analysis. MACRO TO MICRO VERSATILITY PRELIMINARY INSPECTION AND MICRON-LEVEL ANALYSIS WITH ONE SYSTEM * See the whole picture: 23X to 8220X magnification range * Minimize the chance of crashing into your sample * See your sample from many angles Supported models MULTIPLE OBSERVATIONS WITH A SINGLE CLICK INSTANT SWITCHING SAVES TIME * All observation methods are available at all magnifications * Choose from 6 observation methods, and switch between them with a single click Supported models BE CONFIDENT IN YOUR RESULTS GUARANTEED* MEASUREMENT ACCURACY AND PRECISION * You can be confident in your measurement results with guaranteed* measurement precision * Reliable measurement with on-site calibration Supported models *To guarantee XY accuracy, calibration work must be undertaken by an Olympus service technician. ADVANCED MEASUREMENTS ARE FAST AND EASY TO OBTAIN IMPROVED ANALYSIS FUNCTIONS MAKE THE DSX1000 DIGITAL MICROSCOPE A POWERFUL AND VERSATILE INSPECTION TOOL * Supports complex measurement, including profile , inter-surface step, surface roughness, and more. * Faster analyses with advanced easy-to-use functions Supported models 5 ADVANTAGES OF THE DSX1000 SERIES DIGITAL MICROSCOPE OVER CONVENTIONAL DIGITAL MICROSCOPES 01 ALL-IN-ONE SYSTEM WITH A WIDE MAGNIFICATION RANGE With the DSX1000 digital microscope: Complete your inspection using one easy-to-use system With a conventional digital microscope: Two microscopes, a low-magnification and a high-magnification model, are needed to complete an inspection -------------------------------------------------------------------------------- 02 HIGH-RESOLUTION IMAGE AT HIGH MAGNIFICATION With the DSX1000 digital microscope: High resolution and long working distance in one objective With a conventional digital microscope: Resolution decreases as magnification increases -------------------------------------------------------------------------------- 03 LONG WORKING DISTANCE OBJECTIVES With the DSX1000 digital microscope: Observe uneven samples without bumping into them With a conventional digital microscope: The objective can crash into the sample, potentially damaging it -------------------------------------------------------------------------------- 04 MULTIPLE OBSERVATIONS WITH A SINGLE CLICK With the DSX1000 digital microscope: All 6 observation methods are available at all magnifications With a conventional digital microscope: Only one or two observation methods are available, limiting what can be seen in the sample -------------------------------------------------------------------------------- 05 GUARANTEED ACCURACY AND PRECISION With the DSX1000 digital microscope: Both accuracy and repeatability are guaranteed at all magnifications With a conventional digital microscope: The measurement precision is not guaranteed -------------------------------------------------------------------------------- Get more details about the advantages SERVICE AND SUPPORT YOU CAN TRUST From calibration to training, we offer a broad portfolio of services to help you maintain optimal device performance. Evident service contracts are: * Straightforward—so you can focus on the core of your business * Efficient—we can schedule preventative maintenance, including calibrations, on your behalf * Cost-effective—providing you savings throughout the life of the contract Learn More -------------------------------------------------------------------------------- DSX1000 APPLICATION NOTES See Applications IMPROVE THE SPEED AND EFFICIENCY OF YOUR INSPECTION WITH IMAGE ANALYSIS SOFTWARE OLYMPUS STREAM SOFTWARE The software offers fast, efficient inspection workflows for image acquisition, quantitative measurements and image analysis, reporting, and advanced materials science inspection tasks. Learn More CONTACT US TO LEARN MORE ABOUT DSX1000 APPLICATIONS DSX1000 APPLICATIONS PERFORM HIGHLY ACCURATE THICKNESS MEASUREMENTS OF THE INTERNAL LAYER OF A MULTILAYER CERAMIC CONDENSER Multilayer ceramic condensers (MCLLs) have been attracting attention and it has found widespread use in applications ranging from mobile terminals to automobiles. Moreover, it is expected that large quantities of MCLLs will be incorporated into 5G devices. The DSX1000 it easy to measure thickness of the Internal layer of MCLLs with high resolution. Electronics IC/Wafer USING A DIGITAL MICROSCOPE FOR PRECISE BURR MEASUREMENT ON INJECTION-MOLDED PRODUCTS Olympus' DSX1000 digital microscope makes it easier to obtain optimal images that facilitate the quality control of burrs on injection-molded components. It comes equipped with various functions that enable you to acquire images at the desired magnification, observation method, and illumination angle, and an image-processing function. Metal Fabrication/Mold MEASURING THE THICKNESS OF AUTOMOTIVE PIPE COATINGS USING A DIGITAL MICROSCOPE In the quality control process, inspectors must assess coating thicknesses to make sure they meet specifications and check for thickness variations. DSX1000 provides pattern matching and shading correction algorithms that enable you to stitch images together. Automotive INSPECTING BURRS ON PISTONS USING A DIGITAL MICROSCOPE If there are burrs in the piston’s grooves, it can lead to serious engine issues. DSX1000 offers "Observe small burrs with clear images at low magnification" , "Instantly switch to a higher magnification objective to analyze burrs" and " See the piston ring groove from different angles with a tilting frame" and provide efficient workflow. Automotive OBSERVING THE METAL FLOW IN FORGED PRODUCTS USING A DIGITAL MICROSCOPE There are many parts that are forged, such as gears, valves, and connecting rods used in automobiles. DSX1000 can observe the metal flow that affects toughness using the auto-stitching function. Metal Fabrication/Mold INSPECTING THE BRAZED JOINTS OF RADIATOR FINS USING A DIGITAL MICROSCOPE Radiator are important role in engine cooling and it is essential to confirm the brazing of pipes and fins for quality control. DSX1000's multi-preview function makes it simple to view the sample using multiple observation methods to find the right one and makes inspections more efficient. Automotive MEASURING A CONNECTING ROD’S SLIT WIDTH USING A DIGITAL MICROSCOPE Connecting rods are required to be strong enough to withstand tens of millions of revolutions per minute, and the slit width is strictly controlled. With the DSX1000, the slit width that could not be clearly observed with a conventional microscope can be observed with high accuracy. Automotive INSPECTING A BRAKE PAD’S SURFACE USING A DIGITAL MICROSCOPE A brake pad's surface impacts its performance, including braking force, heat stability, noise, and heat generation. Digital microscopes are used to check that the compounds used to create the brake pad are mixed properly. Automotive INSPECTING BONDING WIRES USING A DIGITAL MICROSCOPE Digital microscopes are effective tools for analyzing defects, such as wire breakage, wire pitch deviation, bonding peeling, and migration that can occur during the bonding process. Electronics IC/Wafer DETECTING DAMAGE ON A DRILL BIT EDGE USING A DIGITAL MICROSCOPE Drill bits are widely used in industrial fields as a cutting tool. If the edge is damaged, inaccuracies may arise during hole positioning, or the drill may break. Conventional digital microscope is commonly used to perform drill inspection, but there are challenges. The DSX1000 offers advantages of detecting damage on a drill bit edge. Metal Fabrication/Mold DETECTING MANUFACTURING DEFECTS ON SEMICONDUCTOR WAFERS USING A DIGITAL MICROSCOPE Semiconductors are essential components in many electronic devices. Defects can be introduced into the circuit during manufacturing process, and visual inspection using a microscope is a preferred option to inspect defects. The DSX1000 simplifies semiconductor visual inspection. Electronics IC/Wafer HOW A DIGITAL MICROSCOPE’S DEEP FOCAL DEPTH ENABLES THE COMPLETE INSPECTION OF CONNECTOR PINS Manufacturers use strict quality control measures to minimize failures of electrical connector pins, and microscopes play an essential role. The DSX1000 microscope’s objective lenses offer the depth of focus and resolution required to focus an entire connector pin at the same time, greatly simplifying and speeding up the inspection process. Electronics IC/Wafer ANALYZING FRACTURED METAL SURFACES WITH A DIGITAL MICROSCOPE Fractography has become increasingly important as infrastructure continues to age and quality control issues cause problems. Optical or digital microscopes are essential fractography tools that are used to capture high-quality images for analysis. See details of advantages which DSX1000 can offer to analyze factured metal surfaces. Metal Fabrication/Mold MEASURING THE VOLUME OF INTEGRATED CIRCUIT CHIPPING AFTER THE DICING PROCESS USING A DIGITAL MICROSCOPE During the dicing process of integrated circuit (IC) manufacturing, amount of allowable roughness of wafer surface is carefully controlled. Amount of roughness is checked with a digital microscope, but the physical properties of IC chips can be challenging. The DSX1000 objective lenses offer high resolution at low magnification to reduce shading and flare, enabling inspectors to more easily see chipping during low-magnification observations. Electronics IC/Wafer INSPECTING GLASS FIBER PEELING IN A PRINTED WIRING BOARD’S GLASS EPOXY SUBSTRATE—CLEAR IMAGES ARE ESSENTIAL FOR QUALITY CONTROL Inspection of resin peeling defects is critical as these defects can cause a completed PWB to have lower insulation and heat resistance, making them more susceptible to failure. PWBs are challenging to inspect with a microscope. The DSX1000 digital microscope has advanced telecentric optics and high-resolution objectives that offer an excellent depth of focus, which enable you to observe an etched PWB to investigate the cause of a defect. Electronics IC/Wafer ACQUIRING CLEAR IMAGES AND ACCURATE DIMENSION MEASUREMENTS OF A LAMINATED CERAMIC CAPACITOR USING A DIGITAL MICROSCOPE Manufacturers measure the laminated ceramic capacitors’ dimensions and visually inspect them to look for cracks in the ceramic. Microscopes or digital microscopes is used to supplement the automated inspection system, but poses challenges. The DSX1000 offers multiple advantages to inspect capacitors. Electronics IC/Wafer MEASURING THE CIRCUIT SHAPE OF A PRINTED WIRING BOARD USING A DIGITAL MICROSCOPE During the manufacturing process of PWBs, a microscopic inspection is necessary to analyze circuit shape precisely. There are multiple advantages of measuring circuit shape with the DSX1000. Electronics IC/Wafer Automotive View Applications Electronics IC/Wafer View Applications Metal Fabrication/Mold View Applications Chemical/Materials, Glass, and Ceramics View Applications Other View Applications CONTACT US TO LEARN MORE ABOUT DSX1000 Home/ Products/ Digital Microscopes/ DSX1000 Print * Thickness and Flaw Inspection Solutions▾ * Flaw Detectors / Phased Array Flaw Detectors▾ * Ultrasonic Flaw Detectors▾ * EPOCH 6LT * EPOCH 650 * Probes and Transducers * Phased Array▾ * OmniScan X3 and OmniScan X3 64 * OmniScan MX2 * OmniScan SX * FOCUS PX / PC / SDK * PipeWIZARD * Eddy Current Products▾ * NORTEC 600 * Rotating Bolthole Scanners * Tube Probes * Eddy Current Array Products▾ * OmniScan MX ECA/ECT * Eddy Current Probes * Bond Testing▾ * BondMaster 600 * BondMaster Probes * 35RDC * Thickness Gauges▾ * 27MG * 45MG * 38DL PLUS * Magna-Mike 8600 * 35RDC * Transducers and Accessories * 72DL PLUS * Transducers and Probes▾ * Single and Dual Element Transducers ▾ * Angle Beam * Atlas European Standard * AWS Wedges & Transducers * CDS Wedges * Contact * Delay Line * Dual Element * EMAT * High-Frequency * Immersion Transducers * Immersion Special * Immersion Accessories * Integral Angle Beam * Normal Incidence Shear Wave * Protected Face * RTD * Special Applications * Spot Weld * Standard Angle Beam * TOFD * Test Blocks * Transducer Cables * Couplant & Adaptors * Eddy Current Probes * Probes for Tube Inspection * Phased Array Probes▾ * EdgeFORM * Weld Series * Dual Array Probes for Welds * Dual Array Probes for Corrosion * Flexible Phased Array Probe * Manual Contact Probes * Small-Footprint Probes * Universal Probes * Near-Wall Probes * Deep Penetration Probes * Immersion Probes * Curved Array Probes * Immersion Corner Wedges for Curved Array Probes * Integrated Wedge and Code Compliant Probes * Wedges * HTHA Probe * RexoFORM Wedge * BondMaster Probes * Automated Inspection Systems▾ * Wheel Inspection * Bar Inspection ▾ * Bar Inspection System (BIS)—Phased Array * Bar Inspection System (BIS)—Eddy Current Array * Rotating Billet Inspection System (RBIS) * FOX-IQ * Square Billet Inspection System (SBIS) * Tube Inspection ▾ * Rotating Tube Inspection System (RTIS) * In-Line ERW Tube Inspection System * In-Line ERW High-Temperature Inspection System * Off-Line ERW Tube Inspection System * FOX-IQ * PipeWIZARD * LSAW Tube Inspection System * Tube End Inspection System (TEIS) * Friction Stir Weld Inspection * NDT Systems Instrumentation ▾ * FOCUS PX / PC / SDK * QuickScan * NDT Industrial Scanners▾ * Weld Inspection Scanners▾ * AxSEAM * SteerROVER * WeldROVER * HST-Lite * Mini-Wheel * COBRA * HSMT-Compact * HSMT-Flex * HST-X04 * VersaMOUSE * Wire Encoder * Corrosion Inspection Scanners▾ * FlexoFORM * SteerROVER * MapSCANNER * MapROVER * HydroFORM Scanner * ChainSCANNER * GLIDER * VersaMOUSE * Mini-Wheel * Aerospace/Wind Blade Inspection Scanners▾ * RollerFORM * Mini-Wheel * GLIDER * VersaMOUSE * Scanner Accessories▾ * CFU Couplant Feed Unit * TRPP 5810 Remote Pulser/Preamplifier * Elastomer Couplant * Interbox * The Olympus Scientific Cloud * Software▾ * WeldSight™ Software * TomoView Software▾ * TomoVIEWER Software -Free * NDT SetupBuilder Software * OmniScan MX2 and SX Software * OmniPC 4 Software * Videoscopes and Borescopes▾ * Videoscopes▾ * IPLEX NX * IPLEX GAir * IPLEX GX/GT * IPLEX G Lite and IPLEX G Lite-W * IPLEX TX * IPLEX Long Scope Solution * Fiberscopes▾ * Small Diameter Fiberscopes * Light Sources * Inspection Assist Software▾ * InHelp * Industrial Microscopes▾ * Laser Confocal Microscopes▾ * OLS5100 * Digital Microscopes▾ * DSX1000 * Measuring Microscopes▾ * STM7 * STM7-BSW * Cleanliness Inspector▾ * CIX100 * Light Microscopes▾ * Upright Microscopes▾ * BX53M * Inverted Microscopes▾ * Inverted Microscopes Solutions * GX53 * Modular Microscopes▾ * BXFM * BXFM-S * BXC Series * Semiconductor & Flat Panel Display Inspection Microscopes▾ * MX63 / MX63L * AR Microscopes▾ * SZX-AR1 * Stereo Microscopes▾ * SZX16 * SZX10 * SZX7 * SZ61/SZ51 * Digital Cameras▾ * DP28 * DP74 * SC180 * DP23 * LC35 * DP23M * Image Analysis Software▾ * PRECiV * OLYMPUS Stream * Objective Lenses▾ * MPLAPON * MPLAPON-Oil * MXPLFLN * MXPLFLN-BD * MPLN * MPLN-BD * MPLFLN * MPLFLN-BD * MPLFLN-BDP * LMPLFLN * LMPLFLN-BD * SLMPLN * LCPLFLN-LCD * LMPLN-IR/LCPLN-IR * White Light Interferometry Objective * OEM Microscope Components for Integration * Industrial Microscope FAQ * Customized Solutions * XRF Analyzers▾ * Handheld and Portable XRF Analyzers▾ * Vanta * Vanta Element * Benchtop and Showroom XRF Analyzers▾ * Vanta * Vanta Element * Vanta GX * In-Line XRF Analysis * Positive Material Identification Equipment▾ * X-STREAM * Applications and Solutions Key * The Olympus Scientific Cloud * Support▾ * Contact Us * Service Solutions▾ * Home * Service Centers * Olympus Scientific Cloud * Software Downloads * User Manuals * ISO Certifications * MSDS Datasheets * Compliance and Ethics at Evident * Product Information * Discontinued and Obsolete Products▾ * MultiScan MS5800 ▾ * MultiView Software * TubePro Software * EVIDENT Modern Slavery Act Statement * Applicable products for safety leaflet (IE) * Resources▾ * Applications Notes * Videos * Webinars * Tutorials * White Papers * FAQs * Olympus InSight Blog Copyright EVIDENT, All rights reserved. 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