ieeeaitest.com Open in urlscan Pro
198.252.98.62  Public Scan

Form analysis
0 forms found in the DOM

Text Content

Skip to content
IEEE AITest 2024
 * Home
 * Call for Contributions
   * Topics of Interest
   * Call for Papers
   * Important Dates
   * Paper Submission
 * Presentation Guidelines
 * Registration
 * Committees
 * Venue
 * Program


HOME


IEEE AITEST 2024
THE 6TH IEEE INTERNATIONAL CONFERENCE ON ARTIFICIAL INTELLIGENCE TESTING
JULY 15-18, 2024 | SHANGHAI, CHINA

SCOPE

IEEE AITest 2024 conference is the sixth edition of a serious IEEE conference
with focus on the synergy of AI and software testing. The first IEEE AITest
conference took place in April 2019 at New York City, CA, USA. The second and
third took place in August 2020 and 2021, respectively, both online due to the
COVID-19 pandemic. The fourth took place in August 2022 in the San Francisco Bay
Area. While the fifth took place in July 2023 at Athens, Greece. This years’
conference is scheduled to take place in Shanghai, China, from 15-18 July 2024.
The conference is part of IEEE CISOSE 2024 congress.



 * Call for Papers
 * Final submission deadline: April 1, 2024 (second-round review)

CONTACT

 * General Inquiries: hzhu@brookes.ac.uk (Hong Zhu)
 * Program Inquiries: Junhua.ding@unt.edu (Junhua Ding)


IEEE AITEST 2024 ANNOUNCEMENTS

We are pleased to announce that the inform you that a special issue “AI Test” of
Electronics, MDPI (Impact factor = 2.690) has been released. The special is now
open for submission. All the papers accepted by IEEE AI Test 2024 are encouraged
to submit an extended version to this special issue. 


ASSOCIATED EVENTS

Menu

 * IEEE CISOSE Congress
 * IEEE Future Technology Summit
 * IEEE BigDataService
 * IEEE DAPPS
 * IEEE JointCloud
 * IEEE MobileCloud
 * IEEE SOSE


SPONSORED BY





COPYRIGHT © 2024 | ALL RIGHTS RESERVED