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GROUP
 * Markets
   * Advanced Manufacturing
   * Aerospace & Automotive
   * Archaeology&Paleontology
   * Consumer Electronics
   * Defense & Security
   * Medical Devices
   * Optics
   * Tooling
   * CASE STUDIES
 * Products
   * SYSTEMS
     * S wideNEW
     * S neox
     * S neox Five Axis
     * S lynx
     * S mart & S onix
     * All products
   * ANALYSIS
     * Manual
       * SensoVIEW
       * SensoMAP
     * Automation
       * SensoPRO
 * Products
   * S wideNEW
   * S neox
   * S neox Five Axis
   * S lynx
   * S mart & S onix
   * SensoVIEW
   * SensoMAP
   * SensoPRO
   * All products
 * Technology
   * Measuring principles
   * ISO 25178 standard
   * European projects
   * Partnership & Membership
   * Sensofar’s papers
 * Webinars
 * About us
   * Welcome
   * Location
   * Contact
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S NEOX

3D Optical Profiler
 * Features
 * Design
 * Software
 * Specifications
 * 





Simply
powerful



The new S neox optical profilometer outperforms existing optical 3D profiling
microscopes in terms of performance, functionality, efficiency and design,
providing Sensofar with a class-leading areal measurement system.









FASTER THAN EVER



Everything is faster than before with new smart and unique algorithms and a new
camera. Data acquisition is taken at 180 fps. Standard measurement acquisition
is 5X faster than before. Making the S neox optical profilometer, the fastest
areal measurement system in the market.








EASY-TO-USE



Sensofar is continuously working to provide the most incredible experience to
our customers. With the fifth generation of the S neox systems, the goal has
been to make it easy to use, intuitive and faster. Even if you are beginner
user, the system can be managed with just one click. Software modules have been
created to adapt the system to the user requirements.








VERSATILE SYSTEM







QUALITY CONTROL


QUALITY CONTROL

Automated modules have been created
to facilitate all QC procedures. Ranging
from operator access rights control, recipes,
compatibility to barcode/QR readers, and
customized plugins from our proprietary
SensoPRO software to generate pass/fail
reports. Our optimized solutions are able
to work in Quality Control environments
due to their flexibility and easy-to-use interface,
which can be programmed to work 24/7.
Surface finish measures have never been so easy.


RESEARCH & DEVELOPMENT


RESEARCH & DEVELOPMENT

With Sensofar’s 3-in-1 approach –a single
click in SensoSCAN switches the system to
the best technique for the task at hand. The
three measurement techniques found in the
S neox sensor head –Confocal, Interferometry,
Ai Focus Variation– each contribute critically
to the versatility of the system and help to
minimize undesirable compromises in the
data acquisition. The S neox optical profilometer
is ideal for all lab environments,
without limitations.







QUALITY CONTROL


QUALITY CONTROL

Automated modules have been created
to facilitate all QC procedures. Ranging
from operator access rights control, recipes,
compatibility to barcode/QR readers, and
customized plugins from our proprietary
SensoPRO software to generate pass/fail
reports. Our optimized solutions are able
to work in QC environments due to their
flexibility and easy-to-use interface, which
can be programmed to work 24/7.
Surface finish measures have never been so easy.


RESEARCH & DEVELOPMENT


RESEARCH & DEVELOPMENT

With Sensofar’s 3-in-1 approach –a single
click in SensoSCAN switches the system to
the best technique for the task at hand. The
three measurement techniques found in the
S neox sensor head –Confocal, Interferometry,
Ai Focus Variation– each contribute critically
to the versatility of the system and help to
minimize undesirable compromises in the
data acquisition. The S neox optical profilometer
is ideal for all lab environments,
without limitations.







4-IN-1 TECHNOLOGIES




AI FOCUS VARIATION



Active illumination Focus Variation vertically scans either optics (with very
low depth-of-field) or the sample to obtain a continuous set of images of the
surface. An algorithm determines which points in each frame are in focus, and an
entire image is built up using all in-focus points from all frames. It has been
improved with the use of active illumination to get more reliable focus location
even on optically smooth surfaces.





CONFOCAL



The imaging technique included by the Confocal microscopes, utilizes an aperture
at the confocal plane of the objective. Out-of-focus light is thus prevented
from entering the imaging system and only the in-focus plane on the sample is
captured. 2D profiles and 3D surface images can be captured by scanning the
aperture mechanically or digitally.






INTERFEROMETRY



Optical Interferometry makes use of the optical path difference between light
reflected in the two arms of the interferometer (reference and sample) to yield
an spatial interference pattern (interferograms) that contains information on
the surface topology of the sample. Various variations of the approach can be
used for particular applications.






THIN FILM



Thin film measurement technique measures the thickness of optically transparent
layers quickly, accurately, non-destructively and requires no sample
preparation. The profilometer acquires the reflectance spectrum of the sample in
the visible range, and is compared with a simulated spectra calculated by the
software, with layer thickness modification until the best fit is found.
Transparent films from 50 nm to 1.5 μm can be measured in less than one second.
Sample evaluation spot diameter is dependent on the objective magnification
which can be as low as 0.5 μm and up to 40 μm.










IMPROVING PERFORMANCE USING A LED



The advantages of using a LED over a laser are vast. LEDs avoid interference
patterns and scattering typical of laser light sources. LEDs illuminate an area,
rather than a single spot, yielding faster measurement. The estimated lifetime
of an LED is about 50.000 h (25 times better than a laser). Finally, they offer
great versatility, allowing different wavelengths to be used depending on sample
requirements.









SYSTEM VALIDATION PACKAGE



Every S neox is manufactured to deliver accurate and traceable measurements.
Systems are calibrated using traceable standards following the ISO 25178
standard part 700 and part 600 for: Z amplification factor, XY lateral
dimensions, flatness deviation, system noise as well as parcentricity and
parfocality. Any metrology instrument must fulfill it before providing any
result.





Every S neox is calibrated to estimate the
metrological characteristics using a traceable calibration standard, adjusted to
correct systematic errors and verified to match the calibrated value. Finally,
the performance specifications are checked, and the instrument characteristics,
such as accuracy, and repeatability are provided with the system.


ISO Standard






HIGH RESOLUTION



Vertical resolution is limited by the instrument noise, which is fixed for
Interferometry, but dependent of the numerical aperture for Confocal. Sensofar
proprietary algorithms deliver nanometer level system noise for any measurements
technique at the highest possible lateral resolution for an optical instrument.
The topography shown is a subnanometer (0.3 nm) atomic layer. Courtesy of PTB.








DIC OBSERVATION



Differential Interference Contrast (DIC) is used to emphasize very small height
features that has no contrast in normal observation. With the use of a Nomarski
prism, an interferential image is created resolving sub-nanometer scale
structures not visible in brightfield or confocal images.








GET ANSWERS TO YOUR QUESTIONS!
CONNECT WITH AN EXPERT



JUST WRITE US AN EMAIL OR SEARCH FOR
A DIRECT CONTACT NEAR YOU.








GET ANSWERS TO YOUR QUESTIONS!
CONNECT WITH AN EXPERT



JUST WRITE US AN EMAIL OR SEARCH FOR
A DIRECT CONTACT NEAR YOU.














Home / Metrology / Products / S neox
3D Optical profilometer and stent inspection systems

Based in Barcelona, working with clients worldwide.

+34 937 001 492

info@sensofar.com


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       * SensoVIEW
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   * S neox
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   * S lynx
   * S mart & S onix
   * SensoVIEW
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