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X-ray Diffraction (XRD)


DIFFRAC.SUITE SOFTWARE FAMILY

DIFFRAC.SUITE represents a software platform offering a wide range of modules
for easy X-ray diffraction data acquisition and evaluation with all the
advantages of modern software for maximum ease of use.

Bruker Store

The DIFFRAC.SUITE software guides novice users through streamlined method
development and execution while assisting experts in an unobtrusive manner. The
fully customizable user-interface is characterized by an ergonomic plug-in
framework, providing for common look & feel and operation of all current
generation XRD instruments.


From the MEASUREMENT CENTER our D2 PHASER, D8 ENDEAVOR, and D8 ADVANCE and
DISCOVER family instruments can be operated fully interactive by the expert
while at the same time a simple push-button and touch-control operation makes
them accessible to any operator.

The same idea holds for the data analysis part of DIFFRAC.SUITE. It covers
anything between automated data evaluation after a measurement is finished, to
fully interactive evaluations by the X-ray specialist. Available packages
comprise DIFFRAC.EVA for general data evaluation, powder analysis software
(TOPAS, DQUANT, SAXS), and materials research analysis Software (LEPTOS,
TEXTURE, XRR).




HIGHLIGHTS




OPERATION MODES

The DIFFRAC.SUITE family is based on a client/server architecture and supports
unlimited networking. The software

 * allows access and control of any number of D2 PHASER, D8 ADVANCE, D8 DISCOVER
   and D8 ENDEAVOR diffractometers within a customer's network,
   
 * provides the opportunity for BRUKER service to remote diagnose the hardware,
   
 * enables our application experts to maintain customer specific applications.

The “island mode” provides stand-alone operation without the need for a network.
The platform concept of DIFFRAC.SUITE also allows for data exchange with our
elemental analyzers.


FOR THE COMPLIANT LAB – 21CFR PART 11

Our software is being developed by applying a formal design process and product
development life cycle according to Bruker AXS's ISO9001 certified product
development procedures. Written standards exist such as coding standards,
configuration management, programmer qualifications, software version control,
maintenance, formal testing of software/hardware, incident reporting and
tracking, and disaster recovery.

To integrate into an FDA’s 21CFR Part 11 (or other) compliant laboratory,
DIFFRAC.SUITE Part 11 software offers tools to provide and guarantee
authenticity, integrity and confidentiality of electronic records and electronic
signatures including: secure system log-ins, automatic audit trail generation,
electronic signatures with reports and data, network security, and tamper proof
data files with the ability to discern invalid or altered records.

 * DIFFRAC.SUITE PART11: The Solution for your Compliant Lab
 * Bruker AXS 21 CFR Part11 Policy White Paper
 * Bruker AXS EU Annex 11 Policy White Paper




DIFFRAC.SUITE SPECIFICATIONS

Platform

Microsoft .NET

 

Operating system

Windows 10 and 11, 64 bit


 

Data storage

Filesystem and SQL database

21 CFR Part 11 database mode only

 


PLAN.MEASURE.ANALYZE WITH DIFFRAC.SUITE

DIFFRAC.COMMANDER

Instrument control, launch immediate measurements, execute predefined methods
and real time monitoring.
READ MORE

DIFFRAC.WIZARD

User guided, graphical method development for basic and advanced measurements.
READ MORE

DIFFRAC.EVA

Perform analysis on 1D and 2D datasets including visualization, phase
identification, basic statistics and semi-quantitative analysis.
Read More


POWDER ANALYSIS SOFTWARE

DIFFRAC.TOPAS

Advanced XRPD data fitting software for quantification and structure solution.
Read More

DIFFRAC.DQUANT

Quantification of phases using standard based correlation methods.
Read More

DIFFRAC.SAXS

Qualitative and quantitative analysis of 1D and 2D Small Angle X-ray Scattering
data.
Read More


MATERIALS RESEARCH ANALYSIS SOFTWARE

DIFFRAC.LEPTOS

Analysis of data collected for high resolution and residual stress applications.
Read More

DIFFRAC.TEXTURE

Reduction and analysis of texture data for orientation determination.
Read More

DIFFRAC.XRR

Determination of thickness, density and roughness from X-ray reflectometry data
collected on thin film samples.
Read More


FURTHER INFORMATION ON XRD AND SAXS

X-RAY DIFFRACTION

Crystallographic structure, material properties and phase analysis of
crystalline and amorphous powders, bulk materials and thin films.
Read More

SMALL-ANGLE X-RAY SCATTERING

Particle analysis and nanomaterial characterization from 0.1µm down to 1nm
Read More

DAVINCI COMPONENTS

Retrofit, upgrade or diversification – various high-end components for X-ray
diffraction like sources, optics, detectors, ambient and non-ambient sample
stages assist to keep track to varying analytical demands.
Read More


CONTACT

Contact Sales

Software & Manuals
Contact Service

Bruker Offices
Consumables & Spares

Request a Quote

© Copyright Bruker 2024
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