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+44 (0) 1925 445225 info@hiden.co.uk*protected email*

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     * pQA Portable Quadrupole Analyser
   * Electrochemistry
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     * LAS Automated High Throughput Leak Analysis System
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 * About
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   * Gas Analysis
     * Atmospheric Gas Reaction Kinetics
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     * View More
   * Nanotechnology
     * Near Atmospheric XPS, APXPS
   * FIB-SIMS for Nano-Scale Materials Analysis
   * Plasma Characterisation
   * Residual Gas Analysis
     * Thin Film Optical Coating
     * Vacuum Processing
     * Vacuum Process Gas Analysers for CVD / MOCVD / ALD
   * SIMS Surface Analysis and SNMS Surface Analysis
     * FIB-SIMS for Nano-Scale Materials Analysis
   * Thermal Analysis Mass Spectrometer Systems
   * Thin Films and Surface Engineering
     * Near Atmospheric XPS, APXPS
     * Vacuum Process Gas Analysers for CVD / MOCVD / ALD
   * UHV Surface Science


Select Page
 * Products
   * Gas Analysis
     * QGA
     * HPR-20 R&D
     * HPR-20 EGA
     * HPR-70
     * Sampling Inlets
     * View More
   * Catalysis and Thermal Analysis
     * CATLAB-PCS
     * HPR-20 EGA
     * SpaciMS
     * TPD Workstation
     * View More
   * Dissolved Gas Analysis
     * HPR-40 DSA – MIMS
     * pQA Portable Quadrupole Analyser
   * Electrochemistry
     * HPR-40 DEMS
     * FIB-SIMS for Nano-Scale Materials Analysis
     * LAS Automated High Throughput Leak Analysis System
   * Residual Gas Analysis
     * RGA Series
     * HMT
     * HAL 201 RC
     * HALO RGA
     * IDP
     * View More
   * Thin Films, Plasma, Surface Engineering
     * HPR-30 Series
     * EQP Series
     * ESPion
     * IMP-EPD
     * View More
   * Surface Analysis
     * Compact SIMS
     * AutoSIMS
     * ToF-qSIMS Workstation
     * XPS for SIMS
     * SIMS Workstation
     * View More
   * Nanotechnology
     * SIMS Workstation
     * TPD Workstation
     * HPR-60 MBMS
     * XBS
     * FIB-SIMS for Nano-Scale Materials Analysis
   * Quadrupoles for Cluster Analysis
     * Cluster Series Systems
     * Quadrupole Components for Cluster Studies
     * Ion Beam Deflector
   * Software
     * MASsoft Professional
     * QGA 2
     * iRGA
     * EGAsoft
 * About
   * What We Do
   * Careers
 * Applications
   * Gas Analysis
     * Fermentation / Bio Reactor Monitoring
     * Gas Production and Storage
     * Glovebox Monitoring
     * View More
   * Catalysis and Thermal Analysis
     * Surface Chemistry
     * Automotive Catalysts
     * Biocatalysis
     * Catalyst Characterisation
     * View More
   * Electrochemistry
     * DEMS
     * CO2 Reduction
     * Lithium Ion Battery Development
     * Fuel Cell Studies
     * View More
   * Environmental
     * Dissolved Species Analysis
     * Volcanic Gas, Water and Sediment Analysis
     * Biogas
     * View More
   * Residual Gas Analysis and Vacuum Processing
     * Freeze Drying
     * Molecular Beam Studies
     * MBE
     * View More
   * Surface Analysis
     * FIB-SIMS for Nano-Scale Materials Analysis
     * SIMS Surface Analysis and SNMS Surface Analysis
   * Thin Films, Plasma, Surface Engineering
     * Plasma Characterisation
     * Thin Film Optical Coating
     * Thin Films and Surface Engineering
     * View More
   * Atmospheric Plasma Medicine and Polymers
     * Plasma Treatment of Polymers for Medical Applications
     * Plasma Medicine
     * Explosive Detection Using Plasma-Assisted Desorption Ionization (PADI)
   * Fusion & High Energy Physics
     * Fusion Research
     * Synchrotron Vacuum
     * Synchrotron Materials Science
     * Particle Accelerators – Vacuum
     * View More
   * Other
     * Cluster Studies
     * Nanotechnology
     * Near Atmospheric XPS, APXPS
 * Industry
   * Nuclear
   * Food
   * Aerospace
   * Automotive
   * Chemical
   * Semiconductor
   * Pharmaceutical
 * Tech Data
   * Key Concepts
     * Mass Spectrometry in Real Time
     * A SIMS Primer
     * EQP Plasma Ion Analyser
     * How An RGA Works
     * A Guide to Threshold Ionisation Mass Spectroscopy
   * Useful Web Links
     * Institute of Physics
     * Vacuum Guide
     * Physics World
     * View More
   * Fundamental Data
     * Academic Papers
     * Appearance Potentials
     * Cracking Patterns
     * View More
 * Support
   * Technical Support
   * Find a representative
 * News & Media
   * Upcoming Exhibitions
   * News & Press
   * Blog
   * Events
   * Webinars
   * Research
 * Contact
 * Applications
   * Catalysis
   * Dissolved Species Analysis
   * Cluster Studies
   * Fusion Research
   * Gas Analysis
     * Atmospheric Gas Reaction Kinetics
     * Biogas
     * DEMS
     * View More
   * Nanotechnology
     * Near Atmospheric XPS, APXPS
   * FIB-SIMS for Nano-Scale Materials Analysis
   * Plasma Characterisation
   * Residual Gas Analysis
     * Thin Film Optical Coating
     * Vacuum Processing
     * Vacuum Process Gas Analysers for CVD / MOCVD / ALD
   * SIMS Surface Analysis and SNMS Surface Analysis
     * FIB-SIMS for Nano-Scale Materials Analysis
   * Thermal Analysis Mass Spectrometer Systems
   * Thin Films and Surface Engineering
     * Near Atmospheric XPS, APXPS
     * Vacuum Process Gas Analysers for CVD / MOCVD / ALD
   * UHV Surface Science




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RGA, PLASMA ION ANALYSIS, SURFACE ANALYSIS AND SIMS END POINT DETECTION.

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ANALYSIS OF GAS AND VAPOR SPECIES IN VACUUM CHAMBERS AND PROCESSES.

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