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JEOL ARM200F MANUAL TRANSMISSION

4/28/2018

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Description The JEM-ARM200CF is a probe aberration corrected 200kV STEM/TEM with
a cold field emission source with 0.35eV energy resolution. For HADF imaging at
200kV this instrument has a resolution of less than 0.08nm. It was installed in
2011 STEM images can be collected from up to four of the five STEM detectors
simultaneously. For TEM Imaging the microscope has two CCD cameras - an upper
4MP camera and a lower 11MP camera.

1 JEM-2100 Transmission electron microscope Operation manual (digest) 2014. For
operators only PC starting for control of the TEM 1. Turn on the PC and the.

For microanalysis the microscope is equipped with a Gatan Enfina EELS and an
Oxford X-max 100TLE windowless SDD X-ray detector In addition to the standard
holders, Double Tilt Heating (1200 degC), Double Tilt Cooling (-170 deg C),
STM-TEM and a Single Tilt Tomography (+/- 70 deg) holders are available for this
microscope For information about the installation visit the Wiki page Reductions
in quoted unassisted rates are offered to groups that use more than 60 hours of
aberration corrected microscope time in a calendar month. Technical
Specifications • STEM resolution (HADF): 0.078nm @ 200kV; 0.105nm @ 120kV;
0.136nm @ 80kV • STEM Resolution (BF) 0.136nm @ 200kV • TEM Resolution: 0.10nm
lattice, 0.19nm point-to-point @ 200kV.

• Accelerating Voltage: 200, 120, 80kV. • Objective lens (TEM): focal length
1.9mm, Cs 0.5mm, Cc 1.1mm, minimum focus step 0.25nm.


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